The IF389 and LSK389 parts are dual JFETs. A single part, (both JFETs) are tested at the same time.
The IF389 is tested and then the LSK389 is tested with just enough time between change out the parts. This is done to make the environment similar for both parts. The parts are set to a bias current of 5mA and a Vds of 5V.
The test is conducted at room temperature.
During the test the parts are set up as a Common Source amplifier, with a large capacitance across the source resistor. The circuits are powered from batteries and enclosed in a shielded box. The parts are scanned from 1Hz to 80 KHz and averaged ten times then saved. This process is repeated 30 times and the saved results are averaged.