IF170 - The Lower Noise & Lower Cost N-Channel JFET

Head-to-Head Comparisons with LSK 170

IF 170 vs LSK 170 family noise comparisons.

More Information about graphical data

Fine Print for the Engineers:

The parts were tested at room temperature using a battery-powered test set that was enclosed in a shielded RF box (Ramsey STE2300). The ‘B’, ’C’ and ‘D’ parts were tested at a 5mA drain current and 3V $V_{ds}$ . The ‘A’ series was tested at an $Id$ of $I_{dss}$ -20% and a Vds of 3V. The spectrum was captured with an Audio Precision APx525 B series audio analyzer.

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